WG2012 104-Channel Bipolar Digital Source Meter12V/200mA CV/CC Mode USB RS232 for Semiconductor & Photonic Device Testing

WG2012 104-Channel Bipolar Digital Source Meter

The WG2012 is a high-density benchtop bipolar multi-channel digital source meter designed for precision voltage/current sourcing and real-time monitoring across up to 104 independent output channels. It combines constant-voltage (CV) and constant-current (CC) output modes with synchronous triggering, making it suited for parallel characterization of semiconductor chips, photonic/optical communication components, and energy storage devices where multi-port electrical testing is required. The instrument is programmable via USB/RS232 and supplied with host software for automated test integration.

Key Features

• 104 output channels in a single benchtop unit: High-density architecture for parallel multi-device testing without stacking multiple single-channel SMUs.
• Bipolar output range ±12 V / ±200 mA: Supports both positive and negative bias, covering forward/reverse characteristics and leakage current measurements.
• 1 mV voltage resolution, 5 mV voltage accuracy: Fine-grained voltage setting for low-level device characterization.
• 0.1 mA current resolution, 0.1 mA current accuracy: Real-time current monitoring with resolution and accuracy matched to leakage and quiescent current testing.
• CV and CC dual output modes: Constant-voltage and constant-current operation selectable per application requirement.
• Synchronous trigger function: Enables simultaneous output changes across channels, useful for coordinated multi-device stress or parameter sweep tests.
• Global and local shutdown: Flexible safety control for protecting sensitive devices during automated testing.
• USB and RS232 programmable control: Integrates with host software and automated test platforms; full-function upper-computer software included.
• Benchtop form factor, 8.2 kg: 450 × 480 × 132 mm, operating temperature -10°C to +50°C.

Typical Applications

• Semiconductor chip I-V characterization and leakage current testing
• Optoelectronic device and optical communication component electrical testing
• Multi-channel parallel stress/aging tests requiring synchronized bias
• Energy storage device performance testing

Laboratory precision multi-point voltage/current sourcing and monitoring